Method of measuring surface plasmon resonance using interference structure of reflected beam profile

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dc.contributorThe University of Toledo
dc.contributorSimon, Henry John
dc.contributorDeck, Robert T.
dc.contributorAndaloro, Richard V.
dc.date2004-05-04
dc.date.accessioned2024-05-25T19:13:32Z
dc.date.available2024-05-25T19:13:32Z
dc.descriptionChanges in optical properties of layered materials are measured by directing an incident wave of finite transverse dimensions toward layered materials under conditions that will produce a propagating surface mode or a waveguide mode in the layered materials. The intensity distribution is measured within the transverse beam profile of the total reflected beam. The profile shows asymmetric structure associated with the excitation of the propagating surface mode or a wave-guide mode. The index of refraction of the layered materials is modified and the reshaped intensity distribution within the transverse beam profile of the total reflected beam is again measured under the same incidence conditions. The measured intensity distributions are compared to detect differences in the indexes of refraction in the layered materials.
dc.formatapplication/pdf
dc.identifierutoledo:1359
dc.identifieriid:utpatents-US6731388
dc.identifierPatent No.: US6731388
dc.identifierAppl. No.: 09/943696
dc.identifier.urihttps://hdl.handle.net/20.500.14324/6461
dc.language.isoeng
dc.publisherUnited States Patent and Trademark Office
dc.rightsNo Copyright - United States
dc.subject356/445
dc.titleMethod of measuring surface plasmon resonance using interference structure of reflected beam profile
dc.typeText
dc.typepatent

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