Method for measurement of physical characteristics of crystals

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dc.contributorThe University of Toledo
dc.contributorBorgstahl, Gloria E. O.
dc.contributorLovelace, Jeffrey J.
dc.contributorSnell, Edward H.
dc.date2002-12-24
dc.date.accessioned2024-05-25T19:13:25Z
dc.date.available2024-05-25T19:13:25Z
dc.descriptionA method and apparatus to simultaneously measure the diffraction resolution and mosaic spread of macromolecular crystals, are described. The method includes minimizing contributions of an x-ray beam to any reflection angular widths in the crystal, rapidly measuring multi reflection profiles in the crystal over a wide resolution range, evaluating and deconvoluting the Lorentz effect and beam contributions, and determining the direction in which the crystal is most perfect.
dc.formatapplication/pdf
dc.identifierutoledo:1354
dc.identifieriid:utpatents-US6498829
dc.identifierPatent No.: US6498829
dc.identifierAppl. No.: 09/894511
dc.identifier.urihttps://hdl.handle.net/20.500.14324/6446
dc.language.isoeng
dc.publisherUnited States Patent and Trademark Office
dc.rightsNo Copyright - United States
dc.subject378/73
dc.titleMethod for measurement of physical characteristics of crystals
dc.typeText
dc.typepatent

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