Method for measurement of physical characteristics of crystals
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Abstract/Description: | A method and apparatus to simultaneously measure the diffraction resolution and mosaic spread of macromolecular crystals, are described. The method includes minimizing contributions of an x-ray beam to any reflection angular widths in the crystal, rapidly measuring multi reflection profiles in the crystal over a wide resolution range, evaluating and deconvoluting the Lorentz effect and beam contributions, and determining the direction in which the crystal is most perfect. |
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Subject(s): | 378/73 |
Date Issued: | 2002-12-24 |
Title: | Method for measurement of physical characteristics of crystals. |
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Name(s): |
The University of Toledo, assignee Borgstahl, Gloria E. O., inventor Lovelace, Jeffrey J., inventor Snell, Edward H., inventor |
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Type of Resource: | text | |
Genre: | patent | |
Publisher: | United States Patent and Trademark Office | |
Other Date: | Date Filed: 2001-06-28 | |
Date Issued: | 2002-12-24 | |
Physical Form: | application/pdf | |
Extent: | 28 p. | |
Abstract/Description: | A method and apparatus to simultaneously measure the diffraction resolution and mosaic spread of macromolecular crystals, are described. The method includes minimizing contributions of an x-ray beam to any reflection angular widths in the crystal, rapidly measuring multi reflection profiles in the crystal over a wide resolution range, evaluating and deconvoluting the Lorentz effect and beam contributions, and determining the direction in which the crystal is most perfect. | |
Identifier(s): |
utpatents-US6498829 (IID) Patent No.: US6498829 (patno) Appl. No.: 09/894511 (appno) |
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Subject(s): | 378/73 | |
Held by: | United States Patent and Trademark Office (USPTO) Public Search Facility | |
Location: | University of Toledo Digital Repository | |
Rights Statement: | No Copyright - United States | |
In Collections: |