Abstract

A method and apparatus to simultaneously measure the diffraction resolution and mosaic spread of macromolecular crystals, are described. The method includes minimizing contributions of an x-ray beam to any reflection angular widths in the crystal, rapidly measuring multi reflection profiles in the crystal over a wide resolution range, evaluating and deconvoluting the Lorentz effect and beam contributions, and determining the direction in which the crystal is most perfect.

Document Type

Patent

Primary Class

378/73

Application Number

09/894511

Filing Date

June 2001

Patent Number

US6498829

Assignee(s)

The University of Toledo

Publication Date

12-24-2002

Patent Country

US

Language

en_US

Institution

The University of Toledo

Repository

University of Toledo Libraries

Digital Publisher

Digital Initiatives

Rights

These materials are free of copyright restrictions and are in the public domain within the United States only. The USPTO reserves the right to assert copyright protection internationally.

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Rights Statement

No Copyright - United States. URI: http://rightsstatements.org/vocab/NoC-US/1.0/
The organization that has made the Item available believes that the Item is in the Public Domain under the laws of the United States, but a determination was not made as to its copyright status under the copyright laws of other countries. The Item may not be in the Public Domain under the laws of other countries. Please refer to the organization that has made the Item available for more information.