Document Type

Patent

Abstract

Changes in optical properties of layered materials are measured by directing an incident wave of finite transverse dimensions toward layered materials under conditions that will produce a propagating surface mode or a waveguide mode in the layered materials. The intensity distribution is measured within the transverse beam profile of the total reflected beam. The profile shows asymmetric structure associated with the excitation of the propagating surface mode or a wave-guide mode. The index of refraction of the layered materials is modified and the reshaped intensity distribution within the transverse beam profile of the total reflected beam is again measured under the same incidence conditions. The measured intensity distributions are compared to detect differences in the indexes of refraction in the layered materials.

Patent Country

US

Patent Number

US6731388

Publication Date

5-4-2004

Assignee(s)

The University of Toledo

Application Number

09/943696

Filing Date

August 2001

Primary Class

356/445

Rights

These materials are free of copyright restrictions and are in the public domain within the United States only. The USPTO reserves the right to assert copyright protection internationally.

Institution

The University of Toledo

Repository

University of Toledo Libraries

Digital Publisher

Digital Initiatives

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